BA-1602 Series – 1.6T Bit Analyzer – 8 or 16 channels at 212.5G

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BA-1602 Series – 1.6T Bit Analyzer – 8 or 16 channels at 212.5G

The BA-1602 Series is a high-density electrical BERT platform developed for the testing and validation of next-generation high-speed connectivity. It provides engineers with the tools required to measure bit-error performance, analyze FEC behavior and evaluate signal quality across demanding electrical links.

Available with 8 or 16 channels at 212.5G per channel, the analyzer supports multi-lane testing for 400G, 800G and 1.6T Ethernet technologies. Its PAM4 capabilities make it suitable for evaluating high-speed transceivers, active and passive copper interconnects and emerging optical architectures.

The platform combines BER, FEC and BLER analysis with advanced equalization and parallel testing capabilities. This enables detailed characterization of link performance during research and development, qualification, troubleshooting and production testing.

It also supports testing of modern interconnect technologies such as Linear-Drive Pluggable Optics (LPO), Retimed Linear Receiver (RTLR), Active Electrical Cables (AEC), Active Copper Cables (ACC) and Direct Attach Copper (DAC).

Why Use the BA-1602?

As data rates continue to move toward 800G and 1.6T, accurate multi-lane electrical testing becomes increasingly important. The BA-1602 combines high channel density with advanced BER and FEC analysis to help engineers identify link-level performance issues and validate high-speed connectivity.

Its flexible channel configuration and support for modern interconnect technologies make it suitable for laboratory testing, product development, qualification and manufacturing environments

Key Features

1.6T electrical Bit Error Rate Testing

8- or 16-channel configuration

Up to 212.5G per channel

Support for PAM4 high-speed signaling

Testing for 400G, 800G and 1.6T Ethernet

Real-time FEC generation and analysis

Parallel BER, FEC and BLER testing

Support for LPO, RTLR, AEC, ACC and DAC

I²C and I3C register access for device-level diagnostics

Applications

High-Speed Ethernet Validation Test and validate electrical interfaces used in 400G, 800G and 1.6T Ethernet systems.
AI & Data Center Networks Support the development and qualification of high-bandwidth interconnects used in AI clusters, hyperscale data centers and next-generation network infrastructure.
Optical Transceiver Testing Evaluate the electrical performance of high-speed transceivers and validate BER and FEC performance across multiple lanes.
LPO Testing Characterize Linear-Drive Pluggable Optics and investigate electrical signal impairments, BER performance and FEC margins.
High-Speed Cable Testing Test AEC, ACC and DAC interconnects for error performance and signal integrity.
R&D and Design Validation Perform detailed characterization and troubleshooting during the development of high-speed communication devices and systems.
Manufacturing & Production Use automated, parallel testing to improve the efficiency of production testing for high-speed components and interconnects.
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